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The structure of thermomigration channels in silicon

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Bibliographic Details
Published in:	Technical physics letters 2004-03, Vol.30 (3), p.205-207
Main Authors:	Buchin, É. Yu, Denisenko, Yu. I., Simakin, S. G.
Format:	Article
Language:	English
Citations:	Items that cite this one
Online Access:	Get full text
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