Structural characterization of interfaces in the AlxGa1−x As/GaAs/AlxGa1−x As heterostructures by high-resolution X-ray reflectometry and diffractometry

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Bibliographic Details
Published in:Crystallography reports 2005-09, Vol.50 (5), p.739-750
Main Authors: Lomov, A. A., Sutyrin, A. G., Prokhorov, D. Yu, Galiev, G. B., Khabarov, Yu. V., Chuev, M. A., Imamov, R. M.
Format: Article
Language:English
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ISSN:1063-7745
1562-689X
DOI:10.1134/1.2049390