X-ray Diffraction Study of the Effect of Neutron Irradiation on the Defect Formation in Silicon Crystals Grown by the Czochralski Method and Annealed at High Temperatures

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Bibliographic Details
Published in:Physics of the solid state 2005, Vol.47 (10), p.1863
Main Author: Makara, V. A.
Format: Article
Language:English
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ISSN:1063-7834
DOI:10.1134/1.2087738