X-ray Diffraction Study of the Effect of Neutron Irradiation on the Defect Formation in Silicon Crystals Grown by the Czochralski Method and Annealed at High Temperatures

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Published in:Physics of the solid state 2005, Vol.47 (10), p.1863
Main Author: Makara, V. A.
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Language:English
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title X-ray Diffraction Study of the Effect of Neutron Irradiation on the Defect Formation in Silicon Crystals Grown by the Czochralski Method and Annealed at High Temperatures
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