Measuring the local resistivity by the nanoindentation and force-spectroscopy methods

Methods for measuring the resistivity of materials during elastic and elastoplastic interactions of a current-conducting indenter and a studied sample are described. Analytical methods that describe the dependences of the contact ohmic resistance on the pressure force and the contact stiffness are p...

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Bibliographic Details
Published in:Instruments and experimental techniques (New York) 2013-03, Vol.56 (2), p.233-239
Main Authors: Soshnikov, A. I., Kravchuk, K. S., Maslenikov, I. I., Ovchinnikov, D. V., Reshetov, V. N.
Format: Article
Language:English
Subjects:
Electrical Engineering
Laboratory Techniques
Measurement Science and Instrumentation
Physical Chemistry
Physics
Physics and Astronomy
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Summary:Methods for measuring the resistivity of materials during elastic and elastoplastic interactions of a current-conducting indenter and a studied sample are described. Analytical methods that describe the dependences of the contact ohmic resistance on the pressure force and the contact stiffness are proposed. The considered models are experimentally tested with a NanoScan scanning nanohardness tester using indenters made of boron-doped diamond single crystals.
ISSN:0020-4412
1608-3180
DOI:10.1134/S0020441213020115