Application specific integrated circuits in radiation measuring systems (Review, Part 2)

The purpose of this review is to give experts, who use electronic techniques in experiments or measurements in applied areas, whenever it is possible, a complete picture of the past five-year rapid development of application specific integrated circuits for readouts and processing of signals from up...

Full description

Saved in:
Bibliographic Details
Published in:Instruments and experimental techniques (New York) 2016-03, Vol.59 (2), p.163-195
Main Author: Basiladze, S. G.
Format: Article
Language:English
Subjects:
Electrical Engineering
Measurement Science and Instrumentation
Physical Chemistry
Physics
Physics and Astronomy
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The purpose of this review is to give experts, who use electronic techniques in experiments or measurements in applied areas, whenever it is possible, a complete picture of the past five-year rapid development of application specific integrated circuits for readouts and processing of signals from up-to-date detectors of nuclear particles. Due to the large information content, the review is formally divided into two parts. The use of the application specific integrated circuits in different experimental or measuring plants is considered in this second part. Both parts have the common classification table, numbering of cited papers, drawings, and formulas.
ISSN:0020-4412
1608-3180
DOI:10.1134/S0020441216020305