The phenomenon of conical refraction in a thin-layer periodic semiconductor-dielectric structure in a magnetic field

The propagation of electromagnetic waves along the optical axes of a thin-layer periodic semiconductor-dielectric structure in an external magnetic field (i.e., under conditions of external and internal conical refraction) has been investigated. It is shown that the conditions for conical refraction...

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Bibliographic Details
Published in:Optics and spectroscopy 2012-03, Vol.112 (3), p.474-481
Main Authors: Bulgakov, A. A., Fedorin, I. V.
Format: Article
Language:English
Subjects:
Lasers
Optical Devices
Optics
Photonics
Physical Optics
Physics
Physics and Astronomy
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Summary:The propagation of electromagnetic waves along the optical axes of a thin-layer periodic semiconductor-dielectric structure in an external magnetic field (i.e., under conditions of external and internal conical refraction) has been investigated. It is shown that the conditions for conical refraction can be implemented in certain regions by changing the external magnetic field, wave frequency, and thickness of the layers forming the structure. By varying the above-mentioned characteristics, one can efficiently control the conical refraction parameters; in particular, the opening angles of the cone of internal and external conical refraction and the inclination of the optical axes with respect to the periodicity axis can be varied in a wide range. The results of this study may be useful for designing millimeter-wave, submillimeter-wave, and IR devices.
ISSN:0030-400X
1562-6911
DOI:10.1134/S0030400X12030071