The phenomenon of conical refraction in a thin-layer periodic semiconductor-dielectric structure in a magnetic field

The propagation of electromagnetic waves along the optical axes of a thin-layer periodic semiconductor-dielectric structure in an external magnetic field (i.e., under conditions of external and internal conical refraction) has been investigated. It is shown that the conditions for conical refraction...

Full description

Saved in:
Bibliographic Details
Published in:Optics and spectroscopy 2012-03, Vol.112 (3), p.474-481
Main Authors: Bulgakov, A. A., Fedorin, I. V.
Format: Article
Language:English
Subjects:
Lasers
Optical Devices
Optics
Photonics
Physical Optics
Physics
Physics and Astronomy
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c288t-b035f24868e442615d7b7bb521e8cbafe7941c7f7ac910daaa330bf3348e6cce3
cites cdi_FETCH-LOGICAL-c288t-b035f24868e442615d7b7bb521e8cbafe7941c7f7ac910daaa330bf3348e6cce3
container_end_page 481
container_issue 3
container_start_page 474
container_title Optics and spectroscopy
container_volume 112
creator Bulgakov, A. A.
Fedorin, I. V.
description The propagation of electromagnetic waves along the optical axes of a thin-layer periodic semiconductor-dielectric structure in an external magnetic field (i.e., under conditions of external and internal conical refraction) has been investigated. It is shown that the conditions for conical refraction can be implemented in certain regions by changing the external magnetic field, wave frequency, and thickness of the layers forming the structure. By varying the above-mentioned characteristics, one can efficiently control the conical refraction parameters; in particular, the opening angles of the cone of internal and external conical refraction and the inclination of the optical axes with respect to the periodicity axis can be varied in a wide range. The results of this study may be useful for designing millimeter-wave, submillimeter-wave, and IR devices.
doi_str_mv 10.1134/S0030400X12030071
format article
fullrecord <record><control><sourceid>crossref_sprin</sourceid><recordid>TN_cdi_crossref_primary_10_1134_S0030400X12030071</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1134_S0030400X12030071</sourcerecordid><originalsourceid>FETCH-LOGICAL-c288t-b035f24868e442615d7b7bb521e8cbafe7941c7f7ac910daaa330bf3348e6cce3</originalsourceid><addsrcrecordid>eNp9UM1qwzAMNmODdd0eYDe_QDbLdhLnOMr-oLDDOtgtOI7cuiR2cdxD334O3W2wg5D4foT0EXIP7AFAyMdPxgSTjH0DzwOr4YIsoKx4UTUAl2Qx08XMX5ObadozBqBksyBps0N62KEPYy5Pg6UmeGf0QCPaqE1yGXWeapp2zheDPmGkB4wu9M7QCUeX9f3RpBCL3uGAJsWZSDFjx4hn76i3HlPGbZb0t-TK6mHCu9--JF8vz5vVW7H-eH1fPa0Lw5VKRcdEablUlUIpeQVlX3d115UcUJlOW6wbCaa2tTYNsF5rLQTrrBBSYWUMiiWB814TwzTlf9pDdKOOpxZYO8fW_okte_jZM2Wt32Js9-EYfT7zH9MPOgxx4A</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>The phenomenon of conical refraction in a thin-layer periodic semiconductor-dielectric structure in a magnetic field</title><source>Springer Link</source><creator>Bulgakov, A. A. ; Fedorin, I. V.</creator><creatorcontrib>Bulgakov, A. A. ; Fedorin, I. V.</creatorcontrib><description>The propagation of electromagnetic waves along the optical axes of a thin-layer periodic semiconductor-dielectric structure in an external magnetic field (i.e., under conditions of external and internal conical refraction) has been investigated. It is shown that the conditions for conical refraction can be implemented in certain regions by changing the external magnetic field, wave frequency, and thickness of the layers forming the structure. By varying the above-mentioned characteristics, one can efficiently control the conical refraction parameters; in particular, the opening angles of the cone of internal and external conical refraction and the inclination of the optical axes with respect to the periodicity axis can be varied in a wide range. The results of this study may be useful for designing millimeter-wave, submillimeter-wave, and IR devices.</description><identifier>ISSN: 0030-400X</identifier><identifier>EISSN: 1562-6911</identifier><identifier>DOI: 10.1134/S0030400X12030071</identifier><language>eng</language><publisher>Dordrecht: SP MAIK Nauka/Interperiodica</publisher><subject>Lasers ; Optical Devices ; Optics ; Photonics ; Physical Optics ; Physics ; Physics and Astronomy</subject><ispartof>Optics and spectroscopy, 2012-03, Vol.112 (3), p.474-481</ispartof><rights>Pleiades Publishing, Ltd. 2012</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c288t-b035f24868e442615d7b7bb521e8cbafe7941c7f7ac910daaa330bf3348e6cce3</citedby><cites>FETCH-LOGICAL-c288t-b035f24868e442615d7b7bb521e8cbafe7941c7f7ac910daaa330bf3348e6cce3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids></links><search><creatorcontrib>Bulgakov, A. A.</creatorcontrib><creatorcontrib>Fedorin, I. V.</creatorcontrib><title>The phenomenon of conical refraction in a thin-layer periodic semiconductor-dielectric structure in a magnetic field</title><title>Optics and spectroscopy</title><addtitle>Opt. Spectrosc</addtitle><description>The propagation of electromagnetic waves along the optical axes of a thin-layer periodic semiconductor-dielectric structure in an external magnetic field (i.e., under conditions of external and internal conical refraction) has been investigated. It is shown that the conditions for conical refraction can be implemented in certain regions by changing the external magnetic field, wave frequency, and thickness of the layers forming the structure. By varying the above-mentioned characteristics, one can efficiently control the conical refraction parameters; in particular, the opening angles of the cone of internal and external conical refraction and the inclination of the optical axes with respect to the periodicity axis can be varied in a wide range. The results of this study may be useful for designing millimeter-wave, submillimeter-wave, and IR devices.</description><subject>Lasers</subject><subject>Optical Devices</subject><subject>Optics</subject><subject>Photonics</subject><subject>Physical Optics</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><issn>0030-400X</issn><issn>1562-6911</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNp9UM1qwzAMNmODdd0eYDe_QDbLdhLnOMr-oLDDOtgtOI7cuiR2cdxD334O3W2wg5D4foT0EXIP7AFAyMdPxgSTjH0DzwOr4YIsoKx4UTUAl2Qx08XMX5ObadozBqBksyBps0N62KEPYy5Pg6UmeGf0QCPaqE1yGXWeapp2zheDPmGkB4wu9M7QCUeX9f3RpBCL3uGAJsWZSDFjx4hn76i3HlPGbZb0t-TK6mHCu9--JF8vz5vVW7H-eH1fPa0Lw5VKRcdEablUlUIpeQVlX3d115UcUJlOW6wbCaa2tTYNsF5rLQTrrBBSYWUMiiWB814TwzTlf9pDdKOOpxZYO8fW_okte_jZM2Wt32Js9-EYfT7zH9MPOgxx4A</recordid><startdate>20120301</startdate><enddate>20120301</enddate><creator>Bulgakov, A. A.</creator><creator>Fedorin, I. V.</creator><general>SP MAIK Nauka/Interperiodica</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20120301</creationdate><title>The phenomenon of conical refraction in a thin-layer periodic semiconductor-dielectric structure in a magnetic field</title><author>Bulgakov, A. A. ; Fedorin, I. V.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c288t-b035f24868e442615d7b7bb521e8cbafe7941c7f7ac910daaa330bf3348e6cce3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Lasers</topic><topic>Optical Devices</topic><topic>Optics</topic><topic>Photonics</topic><topic>Physical Optics</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bulgakov, A. A.</creatorcontrib><creatorcontrib>Fedorin, I. V.</creatorcontrib><collection>CrossRef</collection><jtitle>Optics and spectroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Bulgakov, A. A.</au><au>Fedorin, I. V.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The phenomenon of conical refraction in a thin-layer periodic semiconductor-dielectric structure in a magnetic field</atitle><jtitle>Optics and spectroscopy</jtitle><stitle>Opt. Spectrosc</stitle><date>2012-03-01</date><risdate>2012</risdate><volume>112</volume><issue>3</issue><spage>474</spage><epage>481</epage><pages>474-481</pages><issn>0030-400X</issn><eissn>1562-6911</eissn><abstract>The propagation of electromagnetic waves along the optical axes of a thin-layer periodic semiconductor-dielectric structure in an external magnetic field (i.e., under conditions of external and internal conical refraction) has been investigated. It is shown that the conditions for conical refraction can be implemented in certain regions by changing the external magnetic field, wave frequency, and thickness of the layers forming the structure. By varying the above-mentioned characteristics, one can efficiently control the conical refraction parameters; in particular, the opening angles of the cone of internal and external conical refraction and the inclination of the optical axes with respect to the periodicity axis can be varied in a wide range. The results of this study may be useful for designing millimeter-wave, submillimeter-wave, and IR devices.</abstract><cop>Dordrecht</cop><pub>SP MAIK Nauka/Interperiodica</pub><doi>10.1134/S0030400X12030071</doi><tpages>8</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0030-400X
ispartof Optics and spectroscopy, 2012-03, Vol.112 (3), p.474-481
issn 0030-400X
1562-6911
language eng
recordid cdi_crossref_primary_10_1134_S0030400X12030071
source Springer Link
subjects Lasers
Optical Devices
Optics
Photonics
Physical Optics
Physics
Physics and Astronomy
title The phenomenon of conical refraction in a thin-layer periodic semiconductor-dielectric structure in a magnetic field
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T12%3A15%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_sprin&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20phenomenon%20of%20conical%20refraction%20in%20a%20thin-layer%20periodic%20semiconductor-dielectric%20structure%20in%20a%20magnetic%20field&rft.jtitle=Optics%20and%20spectroscopy&rft.au=Bulgakov,%20A.%20A.&rft.date=2012-03-01&rft.volume=112&rft.issue=3&rft.spage=474&rft.epage=481&rft.pages=474-481&rft.issn=0030-400X&rft.eissn=1562-6911&rft_id=info:doi/10.1134/S0030400X12030071&rft_dat=%3Ccrossref_sprin%3E10_1134_S0030400X12030071%3C/crossref_sprin%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c288t-b035f24868e442615d7b7bb521e8cbafe7941c7f7ac910daaa330bf3348e6cce3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true