Model of ion beam guiding using a flat capillary

This work is devoted to the further development of the theoretical model of double guiding of an ion beam using a flat capillary, which has given greater insight into the structure of the charge distribution created on the capillary wall during ion transmission. It is established that in the improve...

Full description

Saved in:
Bibliographic Details
Published in:Surface investigation, x-ray, synchrotron and neutron techniques x-ray, synchrotron and neutron techniques, 2009-04, Vol.3 (2), p.326-330
Main Authors: Pokhil, G. P., Vokhmyanina, K. A., Mironchik, A. I.
Format: Article
Language:English
Subjects:
2008
Chemistry and Materials Science
Materials Science
Moscow
Moscow State University
Proceedings of the XXXVIII International Conference on Physics of Interaction of Charged Particles with Crystals (Skobeltsyn Institute of Nuclear Physics
Russia
Surfaces and Interfaces
Thin Films
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This work is devoted to the further development of the theoretical model of double guiding of an ion beam using a flat capillary, which has given greater insight into the structure of the charge distribution created on the capillary wall during ion transmission. It is established that in the improved model the shape of a beam trace, similar to the one obtained in an experiment, which varies with the change in the angle of the capillary rotation, is observed on a screen.
ISSN:1027-4510
1819-7094
DOI:10.1134/S1027451009020293