Preliminary characterization of semiconductor detectors in the soft X-ray range using synchrotron radiation from the VEPP-4 storage ring

A photodiode developed at the Ioffe Physico-Tech nical Institute (St. Petersburg) and referred to in the literature as the SPD has been preliminarily calibrated by the primary-detector-based method. The possibility of application of SPD photodiodes as radiometric detectors has been investigated. The...

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Bibliographic Details
Published in:Surface investigation, x-ray, synchrotron and neutron techniques x-ray, synchrotron and neutron techniques, 2010-02, Vol.4 (1), p.99-103
Main Authors: Aruev, P. N., Kolokolnikov, Yu. M., Kovalenko, N. V., Legkodymov, A. A., Lyakh, V. V., Nikolenko, A. D., Pindyurin, V. F., Sukhanov, V. L., Zabrodsky, V. V.
Format: Article
Language:English
Subjects:
Chemistry and Materials Science
Materials Science
Surfaces and Interfaces
Thin Films
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Summary:A photodiode developed at the Ioffe Physico-Tech nical Institute (St. Petersburg) and referred to in the literature as the SPD has been preliminarily calibrated by the primary-detector-based method. The possibility of application of SPD photodiodes as radiometric detectors has been investigated. The AXUV-100 photodiode (IRD Inc., United States) was used as a primary detector. The radiation strength of both detectors has been tested. It was revealed that, being more radiation-resistant, the SPD had radiometry characteristics that were not worse than those of the AXUIV-100.
ISSN:1027-4510
1819-7094
DOI:10.1134/S1027451010010167