Simulation of the range of keV-energy electrons in a dielectric target upon spatial charge accumulation

A method is proposed for calculating the relative range of electrons in the material with low conductivity, which surface is coated by a conductive film. The method takes into account the average retarding electric field of spatial charge created in the material. The calculations were carried out us...

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Bibliographic Details
Published in:Surface investigation, x-ray, synchrotron and neutron techniques x-ray, synchrotron and neutron techniques, 2013-03, Vol.7 (2), p.268-270
Main Authors: Kupriyanova, T. A., Minikaev, L. R., Tangishev, R. R., Stepovich, M. A., Filippov, M. N.
Format: Article
Language:English
Subjects:
2012
Chemistry and Materials Science
Materials Science
Moscow
Proceedings of XLII International Conference on Particle Crystal Interaction-2012 (Skobeltsyn Institute for Nuclear Physics MSU
Surfaces and Interfaces
Thin Films
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Summary:A method is proposed for calculating the relative range of electrons in the material with low conductivity, which surface is coated by a conductive film. The method takes into account the average retarding electric field of spatial charge created in the material. The calculations were carried out using the classical generalized Widdington’s law of slowing down within the model of single-collision loss. Due to the approximations used, the calculations have a qualitative character.
ISSN:1027-4510
1819-7094
DOI:10.1134/S1027451013020146