Analysis of frequency dependences of conductance of MIS structures with the fluctuation-and tunneling-based theoretical models taken into account

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Bibliographic Details
Published in:Semiconductors (Woodbury, N.Y.) N.Y.), 2006-06, Vol.40 (6), p.691-696
Main Authors: Avdeev, N. A., Gurtov, V. A., Klimov, I. V., Yakovlev, R. A.
Format: Article
Language:English
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ISSN:1063-7826
1090-6479
DOI:10.1134/S1063782606060157