Electron diffraction study of the phase formation of Tl-Fe-Se and kinetics of phase transformations of films TlFeSe2

The conditions of phase formation in the Tl-Fe-Se system and the crystallization kinetics of amorphous TlFeSe 2 films are investigated by electron-diffraction structural analysis and kinematic electronography. It is shown that the crystallization of amorphous TlFeSe 2 films is described by the analy...

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Bibliographic Details
Published in:Semiconductors (Woodbury, N.Y.) N.Y.), 2014-11, Vol.48 (11), p.1449-1451
Main Authors: Asgerov, E. B., Madadzada, A. I., Ismayilov, D. I., Mehdiyeva, R. N.
Format: Article
Language:English
Subjects:
Interfaces
Magnetic Materials
Magnetism
Physics
Physics and Astronomy
Surfaces
Thin Films
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Summary:The conditions of phase formation in the Tl-Fe-Se system and the crystallization kinetics of amorphous TlFeSe 2 films are investigated by electron-diffraction structural analysis and kinematic electronography. It is shown that the crystallization of amorphous TlFeSe 2 films is described by the analytical expression of kinetic phase-transformation curves V t = V 0 [1 − exp( kt m )]. The growth dimensionality during the crystallization of amorphous TlFeSe 2 equal to three and the activation energies of nucleation and crystal growth are determined.
ISSN:1063-7826
1090-6479
DOI:10.1134/S1063782614110037