Structural parameters of synthetic opals: Statistical analysis of electron microscopy images

The paper reports on a comprehensive study of the statistical characteristics of an ensemble of a -SiO 2 particles in synthetic opals. The results of processing of the electron microscopy images obtained in the investigation of the (111) growth layer are presented. To calculate the statistical param...

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Bibliographic Details
Published in:Physics of the solid state 2008-07, Vol.50 (7), p.1280-1286
Main Authors: Samusev, K. B., Yushin, G. N., Rybin, M. V., Limonov, M. F.
Format: Article
Language:English
Subjects:
Optical Properties
Physics
Physics and Astronomy
Solid State Physics
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Summary:The paper reports on a comprehensive study of the statistical characteristics of an ensemble of a -SiO 2 particles in synthetic opals. The results of processing of the electron microscopy images obtained in the investigation of the (111) growth layer are presented. To calculate the statistical parameters, an algorithm is developed which permits determination of the diameters of a -SiO 2 particles and coordinates of their centers. The algorithm is based on the pattern recognition procedure of objects with radially symmetric boundaries by means of a transformation of the original image similar to the Hough transformation. Our image processing study yields structural parameters of the (111) growth layer, more specifically, the average particle diameter, ∼316 nm, the distribution profile half-width, ∼7%, and the average distance between the centers of neighboring particles, ∼315 nm. The results of the opal image processing are compared with data of optical experiments.
ISSN:1063-7834
1090-6460
DOI:10.1134/S1063783408070147