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Structural parameters of synthetic opals: Statistical analysis of electron microscopy images
The paper reports on a comprehensive study of the statistical characteristics of an ensemble of a -SiO 2 particles in synthetic opals. The results of processing of the electron microscopy images obtained in the investigation of the (111) growth layer are presented. To calculate the statistical param...
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| Published in: | Physics of the solid state 2008-07, Vol.50 (7), p.1280-1286 |
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| Main Authors: | , , , |
| Format: | Article |
| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c288t-b63387d7862ab35fe030cbc671af6de04d5471454cdb4176a58e15be47a11c723 |
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| cites | cdi_FETCH-LOGICAL-c288t-b63387d7862ab35fe030cbc671af6de04d5471454cdb4176a58e15be47a11c723 |
| container_end_page | 1286 |
| container_issue | 7 |
| container_start_page | 1280 |
| container_title | Physics of the solid state |
| container_volume | 50 |
| creator | Samusev, K. B. Yushin, G. N. Rybin, M. V. Limonov, M. F. |
| description | The paper reports on a comprehensive study of the statistical characteristics of an ensemble of
a
-SiO
2
particles in synthetic opals. The results of processing of the electron microscopy images obtained in the investigation of the (111) growth layer are presented. To calculate the statistical parameters, an algorithm is developed which permits determination of the diameters of
a
-SiO
2
particles and coordinates of their centers. The algorithm is based on the pattern recognition procedure of objects with radially symmetric boundaries by means of a transformation of the original image similar to the Hough transformation. Our image processing study yields structural parameters of the (111) growth layer, more specifically, the average particle diameter, ∼316 nm, the distribution profile half-width, ∼7%, and the average distance between the centers of neighboring particles, ∼315 nm. The results of the opal image processing are compared with data of optical experiments. |
| doi_str_mv | 10.1134/S1063783408070147 |
| format | article |
| fullrecord | <record><control><sourceid>crossref_sprin</sourceid><recordid>TN_cdi_crossref_primary_10_1134_S1063783408070147</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1134_S1063783408070147</sourcerecordid><originalsourceid>FETCH-LOGICAL-c288t-b63387d7862ab35fe030cbc671af6de04d5471454cdb4176a58e15be47a11c723</originalsourceid><addsrcrecordid>eNp9kMtOwzAQRS0EEqXwAez8A4GZ2LFddqjiJVViUdghRY4zKanSJLLdRf4eB9ghsZrRzD3zuIxdI9wgCnm7RVBCGyHBgAaU-oQtEFaQKangdM6VyOb-ObsIYQ-AiMVqwT620R9dPHrb8dF6e6BIPvCh4WHq4yfF1vFhtF2449toYxtSIUltb7sptN9C6shFP_T80Do_BDeME28Pdkfhkp01CaWr37hk748Pb-vnbPP69LK-32QuNyZmlRLC6FobldtKFA2BAFc5pdE2qiaQdSE1ykK6upKolS0MYVGR1BbR6VwsGf7MnfcHT005-nSBn0qEcran_GNPYvIfJiRtvyNf7oejT2-Ff6AvZjBowg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Structural parameters of synthetic opals: Statistical analysis of electron microscopy images</title><source>Springer Link</source><creator>Samusev, K. B. ; Yushin, G. N. ; Rybin, M. V. ; Limonov, M. F.</creator><creatorcontrib>Samusev, K. B. ; Yushin, G. N. ; Rybin, M. V. ; Limonov, M. F.</creatorcontrib><description>The paper reports on a comprehensive study of the statistical characteristics of an ensemble of
a
-SiO
2
particles in synthetic opals. The results of processing of the electron microscopy images obtained in the investigation of the (111) growth layer are presented. To calculate the statistical parameters, an algorithm is developed which permits determination of the diameters of
a
-SiO
2
particles and coordinates of their centers. The algorithm is based on the pattern recognition procedure of objects with radially symmetric boundaries by means of a transformation of the original image similar to the Hough transformation. Our image processing study yields structural parameters of the (111) growth layer, more specifically, the average particle diameter, ∼316 nm, the distribution profile half-width, ∼7%, and the average distance between the centers of neighboring particles, ∼315 nm. The results of the opal image processing are compared with data of optical experiments.</description><identifier>ISSN: 1063-7834</identifier><identifier>EISSN: 1090-6460</identifier><identifier>DOI: 10.1134/S1063783408070147</identifier><language>eng</language><publisher>Dordrecht: SP MAIK Nauka/Interperiodica</publisher><subject>Optical Properties ; Physics ; Physics and Astronomy ; Solid State Physics</subject><ispartof>Physics of the solid state, 2008-07, Vol.50 (7), p.1280-1286</ispartof><rights>Pleiades Publishing, Ltd. 2008</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c288t-b63387d7862ab35fe030cbc671af6de04d5471454cdb4176a58e15be47a11c723</citedby><cites>FETCH-LOGICAL-c288t-b63387d7862ab35fe030cbc671af6de04d5471454cdb4176a58e15be47a11c723</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Samusev, K. B.</creatorcontrib><creatorcontrib>Yushin, G. N.</creatorcontrib><creatorcontrib>Rybin, M. V.</creatorcontrib><creatorcontrib>Limonov, M. F.</creatorcontrib><title>Structural parameters of synthetic opals: Statistical analysis of electron microscopy images</title><title>Physics of the solid state</title><addtitle>Phys. Solid State</addtitle><description>The paper reports on a comprehensive study of the statistical characteristics of an ensemble of
a
-SiO
2
particles in synthetic opals. The results of processing of the electron microscopy images obtained in the investigation of the (111) growth layer are presented. To calculate the statistical parameters, an algorithm is developed which permits determination of the diameters of
a
-SiO
2
particles and coordinates of their centers. The algorithm is based on the pattern recognition procedure of objects with radially symmetric boundaries by means of a transformation of the original image similar to the Hough transformation. Our image processing study yields structural parameters of the (111) growth layer, more specifically, the average particle diameter, ∼316 nm, the distribution profile half-width, ∼7%, and the average distance between the centers of neighboring particles, ∼315 nm. The results of the opal image processing are compared with data of optical experiments.</description><subject>Optical Properties</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Solid State Physics</subject><issn>1063-7834</issn><issn>1090-6460</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNp9kMtOwzAQRS0EEqXwAez8A4GZ2LFddqjiJVViUdghRY4zKanSJLLdRf4eB9ghsZrRzD3zuIxdI9wgCnm7RVBCGyHBgAaU-oQtEFaQKangdM6VyOb-ObsIYQ-AiMVqwT620R9dPHrb8dF6e6BIPvCh4WHq4yfF1vFhtF2449toYxtSIUltb7sptN9C6shFP_T80Do_BDeME28Pdkfhkp01CaWr37hk748Pb-vnbPP69LK-32QuNyZmlRLC6FobldtKFA2BAFc5pdE2qiaQdSE1ykK6upKolS0MYVGR1BbR6VwsGf7MnfcHT005-nSBn0qEcran_GNPYvIfJiRtvyNf7oejT2-Ff6AvZjBowg</recordid><startdate>20080701</startdate><enddate>20080701</enddate><creator>Samusev, K. B.</creator><creator>Yushin, G. N.</creator><creator>Rybin, M. V.</creator><creator>Limonov, M. F.</creator><general>SP MAIK Nauka/Interperiodica</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20080701</creationdate><title>Structural parameters of synthetic opals: Statistical analysis of electron microscopy images</title><author>Samusev, K. B. ; Yushin, G. N. ; Rybin, M. V. ; Limonov, M. F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c288t-b63387d7862ab35fe030cbc671af6de04d5471454cdb4176a58e15be47a11c723</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Optical Properties</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Solid State Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Samusev, K. B.</creatorcontrib><creatorcontrib>Yushin, G. N.</creatorcontrib><creatorcontrib>Rybin, M. V.</creatorcontrib><creatorcontrib>Limonov, M. F.</creatorcontrib><collection>CrossRef</collection><jtitle>Physics of the solid state</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Samusev, K. B.</au><au>Yushin, G. N.</au><au>Rybin, M. V.</au><au>Limonov, M. F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural parameters of synthetic opals: Statistical analysis of electron microscopy images</atitle><jtitle>Physics of the solid state</jtitle><stitle>Phys. Solid State</stitle><date>2008-07-01</date><risdate>2008</risdate><volume>50</volume><issue>7</issue><spage>1280</spage><epage>1286</epage><pages>1280-1286</pages><issn>1063-7834</issn><eissn>1090-6460</eissn><abstract>The paper reports on a comprehensive study of the statistical characteristics of an ensemble of
a
-SiO
2
particles in synthetic opals. The results of processing of the electron microscopy images obtained in the investigation of the (111) growth layer are presented. To calculate the statistical parameters, an algorithm is developed which permits determination of the diameters of
a
-SiO
2
particles and coordinates of their centers. The algorithm is based on the pattern recognition procedure of objects with radially symmetric boundaries by means of a transformation of the original image similar to the Hough transformation. Our image processing study yields structural parameters of the (111) growth layer, more specifically, the average particle diameter, ∼316 nm, the distribution profile half-width, ∼7%, and the average distance between the centers of neighboring particles, ∼315 nm. The results of the opal image processing are compared with data of optical experiments.</abstract><cop>Dordrecht</cop><pub>SP MAIK Nauka/Interperiodica</pub><doi>10.1134/S1063783408070147</doi><tpages>7</tpages></addata></record> |
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| ispartof | Physics of the solid state, 2008-07, Vol.50 (7), p.1280-1286 |
| issn | 1063-7834 1090-6460 |
| language | eng |
| recordid | cdi_crossref_primary_10_1134_S1063783408070147 |
| source | Springer Link |
| subjects | Optical Properties Physics Physics and Astronomy Solid State Physics |
| title | Structural parameters of synthetic opals: Statistical analysis of electron microscopy images |
| url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T07%3A02%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_sprin&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Structural%20parameters%20of%20synthetic%20opals:%20Statistical%20analysis%20of%20electron%20microscopy%20images&rft.jtitle=Physics%20of%20the%20solid%20state&rft.au=Samusev,%20K.%20B.&rft.date=2008-07-01&rft.volume=50&rft.issue=7&rft.spage=1280&rft.epage=1286&rft.pages=1280-1286&rft.issn=1063-7834&rft.eissn=1090-6460&rft_id=info:doi/10.1134/S1063783408070147&rft_dat=%3Ccrossref_sprin%3E10_1134_S1063783408070147%3C/crossref_sprin%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c288t-b63387d7862ab35fe030cbc671af6de04d5471454cdb4176a58e15be47a11c723%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |