Field-emission diode with tangential current takeoff from thin-film nanodiamond/graphite emitter

Dependence on the performance characteristics of a field-emission diode with tangential current takeoff from thin-film nanodiamond/graphite (NDG) emitter on the design parameters has been studied. Thin-film NDG emitter structures were formed in the plasma of microwave low-pressure gas discharge. Fie...

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Bibliographic Details
Published in:Technical physics letters 2011-06, Vol.37 (6), p.534-537
Main Authors: Suzdal’tsev, S. Yu, Shanygin, V. Ya, Yafarov, R. K.
Format: Article
Language:English
Subjects:
Classical and Continuum Physics
Physics
Physics and Astronomy
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Summary:Dependence on the performance characteristics of a field-emission diode with tangential current takeoff from thin-film nanodiamond/graphite (NDG) emitter on the design parameters has been studied. Thin-film NDG emitter structures were formed in the plasma of microwave low-pressure gas discharge. Field-emission current densities up to 20 A/cm 2 at a voltage of 300 V were obtained. For the optimum diode design parameters, the tangential current takeoff scheme allows the threshold electric field strength for the onset of field emission to be decreased to less than half of the value typical of the planar field emission from the same NDG structures.
ISSN:1063-7850
1090-6533
DOI:10.1134/S1063785011060137