Method of investigating the parameters of nanoscale films based on multiresonance quartz crystal microbalance and quartz crystal nanobalance technology

The possibilities of studying thin films using quartz crystal microbalance (QCM) and quartz crystal nanobalance (QCN) on the basis of several resonances of several crystals are considered. The system of three quartz resonances is crystals used to measure various physical and mechanical properties of...

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Bibliographic Details
Published in:Nanotechnologies in Russia 2013-03, Vol.8 (3-4), p.229-238
Main Authors: Simonov, V. N., Krasil’nikova, O. K., Matison, N. L.
Format: Article
Language:English
Subjects:
Chemistry and Materials Science
Industrial and Production Engineering
Machines
Manufacturing
Materials Science
Nanotechnology
Processes
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Summary:The possibilities of studying thin films using quartz crystal microbalance (QCM) and quartz crystal nanobalance (QCN) on the basis of several resonances of several crystals are considered. The system of three quartz resonances is crystals used to measure various physical and mechanical properties of chitosan films with thicknesses from 50 to 200 nm. Isotherms of the water-vapor adsorption of chitosan films in the range of humidity from 0 to 99% and a temperature range of 20–70°C, the stresses in the drying film, the density, and Young’s modulus and its behavior in the temperature range are researched.
ISSN:1995-0780
1995-0799
DOI:10.1134/S1995078013020158