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Residual strain measurements in InGaAs metamorphic buffer layers on GaAs

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Bibliographic Details
Published in:	The European physical journal. B, Condensed matter physics Condensed matter physics, 2007-04, Vol.56 (3), p.217-222
Main Authors:	BELLANI, V, BOCCHI, C, PATRINI, M, SERAVALLI, L, TREVISI, G, CIABATTONI, T, FRANCHI, S, FRIGERI, P, GALINETTO, P, GEDDO, M, GERMINI, F, GUIZZETTI, G, NASI, L
Format:	Article
Language:	English
Subjects:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Mechanical and acoustical properties Physical properties of thin films, nonelectronic Physics Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
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