The effect of dielectric top lids on materials processing in a low frequency inductively coupled plasma (LF-ICP) reactor

• Published in: International journal of modern physics. Conference series 2014, Vol.32, p.1460340
• Main Authors: Lim, J. W. M., Chan, C. S., Xu, L., Xu, S.
• Format: Article
• Language: English
• Subjects: Aluminum oxide; Amorphous silicon; Contaminants; Design modifications; Environmental impact; Fourier transforms; Glass substrates; High vacuum; Inductively coupled plasma; Low frequencies; Materials processing; Optical emission spectroscopy; Plasma; Plasma processing; Power transfer; Production lines; R&D; Reduction; Research & development; Secondary ion mass spectroscopy; Spectrum analysis; Thin films
• ISSN: 2010-1945; 2010-1945
• DOI: 10.1142/S2010194514603408

The advent of the plasma revolution began in the 1970's with the exploitation of plasma sources for anisotropic etching and processing of materials. In recent years, plasma processing has gained popularity, with research institutions adopting projects in the field and industries implementing dry processing in their production lines. The advantages of utilizing plasma sources would be uniform processing over a large exposed surface area, and the reduction of toxic emissions. This leads to reduced costs borne by manufacturers which could be passed down as consumer savings, and a reduction in negative environmental impacts. Yet, one constraint that plagues the industry would be the control of contaminants in a plasma reactor which becomes evident when reactions are conducted in a clean vacuum environment. In this work, amorphous silicon (a-Si) thin films were grown on glass substrates in a low frequency inductively coupled plasma (LF-ICP) reactor with a top lid made of quartz. Even though the chamber was kept at high vacuum (~10−4 Pa), it was evident through secondary ion mass spectroscopy (SIMS) and Fourier-transform infra-red spectroscopy (FTIR) that oxygen contaminants were present. With the aid of optical emission spectroscopy (OES) the contaminant species were identified. The design of the LF-ICP reactor was then modified to incorporate an Alumina (Al2O3) lid. Results indicate that there were reduced amounts of contaminants present in the reactor, and that an added benefit of increased power transfer to the plasma, improving deposition rate of thin films was realized. The results of this study is conclusive in showing that Al2O3 is a good alternative as a top-lid of an LF-ICP reactor, and offers industries a solution in improving quality and rate of growth of thin films.