Electron relaxation properties and transient spectroscopy of hydrogenated amorphous silicon

The isothermal-capacitance-transient-spectroscopy (ICTS) and the deep-level-transient-spectroscopy (DLTS) data of a-Si:H are analyzed using a model based on the electronic relaxation theory of Ngai and coworkers. The electron capture and emission processes are taken into account in a selfconsistent...

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 1987-04, Vol.26 (4), p.524-530
Main Authors: HAN, R. Q, TUA, P. F, RUVALDS, J, NGAI, K. L
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Conductivity phenomena in semiconductors and insulators
Electronic transport in condensed matter
Exact sciences and technology
High-field and nonlinear effects
Physics
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Summary:The isothermal-capacitance-transient-spectroscopy (ICTS) and the deep-level-transient-spectroscopy (DLTS) data of a-Si:H are analyzed using a model based on the electronic relaxation theory of Ngai and coworkers. The electron capture and emission processes are taken into account in a selfconsistent manner, and are described by relaxation functions with the same fractional exponent, i.e., φ( t )αexp [-( t /τ * ) 1-λ ], where λ=0.2 and τ * is energy dependent in both processes. This approach (i) explains the anomalous energy and temperature dependence of the effective relaxation rate obtained by the ICTS method and (ii) yields an explanation for the energy difference of the D - states between ICTS and DLTS measurements.
ISSN:0021-4922
1347-4065
DOI:10.1143/jjap.26.524