XPS studies of 80 K-phase Bi-Sr-Ca-Cu-O single crystals

The XPS (X-ray photoelectron spectroscopy) measurements of the 80 K-phase Bi-Sr-Ca-Cu-O single crystals were carried out on surfaces obtained by cleaving in vacuum, by cleaving in air and heating in vacuum, and by Ar + -sputter etching of the air-cleaved-and-heated surface. The chemical bond natures...

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 1990-03, Vol.29 (3), p.L438-L440
Main Authors: KISHIDA, S, TOKUTAKA, H, TODA, F, FUJIMOTO, H, FUTO, W, NISHIMORI, K, ISHIHARA, N
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electron and ion emission by liquids and solids
impact phenomena
Exact sciences and technology
Photoemission and photoelectron spectra
Physics
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Summary:The XPS (X-ray photoelectron spectroscopy) measurements of the 80 K-phase Bi-Sr-Ca-Cu-O single crystals were carried out on surfaces obtained by cleaving in vacuum, by cleaving in air and heating in vacuum, and by Ar + -sputter etching of the air-cleaved-and-heated surface. The chemical bond natures of all the constituent elements from the air-cleaved-and-heated surface are approximately equal to those from the vacuum-cleaved surface. Sr and Ca from the sputtered surface are more oxidized than those from the vacuum-cleaved surface.
ISSN:0021-4922
1347-4065
DOI:10.1143/jjap.29.l438