X-ray photoelectron spectroscopy using a focused-laser-produced plasma X-ray beam

The observation of X-ray photoelectrons induced by laser-produced plasma X-rays has been made for the very first time. Aluminum plasma X-rays were monochromatized to 5.25 nm (236 eV) using a multilayer mirror and focused to 50 µm×70 µm by the Wolter type-I mirror. Au(4f) and SiO 2 (2p) photoelectron...

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 1993-10, Vol.32 (10B), p.L1574-L1576
Main Authors: AOKI, S, OHCHI, T, SUDO, S, NAKAJIMA, K, ONUKI, T, SUGISAKI, K
Format: Article
Language:English
Subjects:
Electron, positron and ion microscopes, electron diffractometers and related techniques
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Scanning probe microscopes, components, and techniques
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Summary:The observation of X-ray photoelectrons induced by laser-produced plasma X-rays has been made for the very first time. Aluminum plasma X-rays were monochromatized to 5.25 nm (236 eV) using a multilayer mirror and focused to 50 µm×70 µm by the Wolter type-I mirror. Au(4f) and SiO 2 (2p) photoelectrons were observed with the hemispherical electrostatic electron energy analyzer. The multichannel detector has been used to detect the pulse photoelectrons of the required energy bands individually.
ISSN:0021-4922
1347-4065
DOI:10.1143/jjap.32.l1574