Photo- and Electron-Beam-Induced Currents from Epitaxial YBa 2 Cu 3 O y Metal-Insulator-Superconductor (MIS) Structure in the Normal State

We present the first report of observation of photoinduced and electron-beam-induced short-circuit currents across the Al/(100)SrTiO 3 /(001)YBa 2 Cu 3 O y metal-insulator-superconductor (MIS) structure in the normal state. Observed current flow is an indication of downward band bending of the YBa 2...

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 1993-04, Vol.32 (4A), p.L491
Main Authors: Iwabuchi, Mamoru, Tatsuhiko Fujii, Tatsuhiko Fujii, Takeshi Kobayashi, Takeshi Kobayashi
Format: Article
Language:English
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Summary:We present the first report of observation of photoinduced and electron-beam-induced short-circuit currents across the Al/(100)SrTiO 3 /(001)YBa 2 Cu 3 O y metal-insulator-superconductor (MIS) structure in the normal state. Observed current flow is an indication of downward band bending of the YBa 2 Cu 3 O y surface layer at the MIS interface, in accordance with the prediction by Hirano et al . based on its large work-function value (Jpn. J. Appl. Phys. 31 (1992) L1345). The electron-beam-induced current (EBIC) image revealed structural defects at the interface. From this image, diffusion length in the (001)YBa 2 Cu 3 O y layer was roughly estimated as 0.1∼0.2 µm.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.32.L491