Time-dependent temperature calculation of aluminum line applied with electrical-overstress pulses

When electrical-overstress (EOS) pulses are applied to an aluminum line, the temperature of the aluminum line will increase due to Joule heating. Since aluminum is a good conductor of heat, some of the heat generated will escape. This causes the deviation of the aluminum-line temperature from that p...

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 1996-07, Vol.35 (7), p.3852-3857
Main Authors: YAMAMOTO, K, TSURU, T
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Testing, measurement, noise and reliability
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Summary:When electrical-overstress (EOS) pulses are applied to an aluminum line, the temperature of the aluminum line will increase due to Joule heating. Since aluminum is a good conductor of heat, some of the heat generated will escape. This causes the deviation of the aluminum-line temperature from that predicted adiabatically. A computer simulation program, which employs the two-dimensional finite-element method, was developed to calculate transient aluminum-line temperature. In this program, the heat transfer coefficient α c is introduced to simulate heat escape. EOS pulse experiments were performed to determine the value of α c of an aluminum line. Using this value, the transient temperature of the aluminum line applied with EOS pulses was simulated. The threshold energy for fusing, which increases the peak temperature of the aluminum line to the fully vaporized point, was calculated for aluminum lines having various widths.
ISSN:0021-4922
1347-4065
DOI:10.1143/jjap.35.3852