Optimized Structures of Multilayer Soft X-Ray Reflectors in the Spectral Range of 30 to 300 Å

For wavelengths in the spectral range of 30 to 300 Å, the structures of multilayer (ML) soft X-ray reflectors for maximum reflectivity at normal incidence were optimized. A dynamical theory of X-ray scattering was employed in the calculation for ideal ML structures. The calculation indicates that th...

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 1998, Vol.37 (5R), p.2728
Main Authors: Dong-Eon Kim, Dong-Eon Kim, Dong-Ho Cha, Dong-Ho Cha, Sang-Won Lee, Sang-Won Lee
Format: Article
Language:English
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Summary:For wavelengths in the spectral range of 30 to 300 Å, the structures of multilayer (ML) soft X-ray reflectors for maximum reflectivity at normal incidence were optimized. A dynamical theory of X-ray scattering was employed in the calculation for ideal ML structures. The calculation indicates that the optimization should be performed for a sufficiently large number of bilayers. The structural parameters optimized for a small number of bilayers do not yield the best performance. It is also observed that for a given number of bilayers, there exists a range of structural parameters for equivalent performance. In the spectral region considered, the maximum reflectivities vary from 40 to 78% with respect to wavelength.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.37.2728