A New Characterization Method of Photocatalytic Activity in Semiconductor Photocatalysts

We propose a new simple method for characterizing photocatalytic activity by measuring photo-generated transient charge separation at the surface of semiconductor photocatalysts. In this method, the charge separation generated by a pulse dye laser is obtained as a function of the incident laser ener...

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 2001-06, Vol.40 (6R), p.4007
Main Authors: Sumita, Taishi, Yamaki, Tetsuya, Yamamoto, Shunya, Miyashita, Atsumi
Format: Article
Language:English
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Summary:We propose a new simple method for characterizing photocatalytic activity by measuring photo-generated transient charge separation at the surface of semiconductor photocatalysts. In this method, the charge separation generated by a pulse dye laser is obtained as a function of the incident laser energy. Using this method, the photocatalytic activity and the type of surface reaction (reduction or oxidation) in titanium dioxide films were rapidly determined.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.40.4007