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Hydrogen-Induced Degradation Mechanisms in Ferroelectric PbZr 0.4 Ti 0.6 O 3 and Bi 3.25 La 0.75 Ti 3 O 12 Thin Films

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Bibliographic Details
Published in:	Japanese Journal of Applied Physics 2002-11, Vol.41 (Part 1, No. 11B), p.6781-6784
Main Authors:	Yoon, Jong-Gul, Seo, Sunae, Kang, Bo Soo, Kim, Jung Dae, Noh, Tae W., Lee, Yong Kyun, Park, Young Soo
Format:	Article
Language:	English
Citations:	Items that cite this one
Online Access:	Get full text
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