Proton Irradiation Experiment for X-ray Charge-Coupled Devices of the Monitor of All-Sky X-ray Image Mission Onboard the International Space Station: II. Degradation of Dark Current and Identification of Electron Trap Level

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 2003, Vol.42 (Part 1, No. 7A), p.4564-4570
Main Authors: Miyata, Emi, Kouno, Hirohiko, Kamiyama, Daisuke, Kamazuka, Tomoyuki, Mihara, Mototsugu, Fukuda, Mitsunori, Matsuta, Kensaku, Tsunemi, Hiroshi, Minamisono, Tadanori, Tomida, Hiroshi, Miyaguchi, Kazuhisa
Format: Article
Language:English
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ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.42.4564