High-Spatial-Resolution Phase Measurement by Micro-Interferometry Using a Hard X-Ray Imaging Microscope

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 2004-03, Vol.43 (No. 3B), p.L421-L423
Main Authors: Koyama, Takahisa, Kagoshima, Yasushi, Wada, Izumi, Saikubo, Akihiko, Shimose, Kenichi, Hayashi, Kenji, Tsusaka, Yoshiyuki, Matsui, Junji
Format: Article
Language:English
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ISSN:0021-4922
DOI:10.1143/JJAP.43.L421