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Hillock-Free Homoepitaxial Diamond (100) Films Grown at High Methane Concentrations
Improved growth processes for homoepitaxial diamond films with high quality and flat surfaces have been presented. Growth hillocks leading to rough surfaces were almost perfectly suppressed under the new growth processes, where the substrate temperature was set to a particular region. The high quali...
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Published in: | Japanese Journal of Applied Physics 2005-01, Vol.44 (1L), p.L216 |
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Language: | English |
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container_issue | 1L |
container_start_page | L216 |
container_title | Japanese Journal of Applied Physics |
container_volume | 44 |
creator | Hamada, Mitsuhiro Teraji, Tokuyuki Ito, Toshimichi |
description | Improved growth processes for homoepitaxial diamond films with high quality and flat surfaces have been presented. Growth hillocks leading to rough surfaces were almost perfectly suppressed under the new growth processes, where the substrate temperature was set to a particular region. The high quality in electronic states was evidenced by the fact that the homoepitaxial films with thicknesses up to 11 µm gave intense free-exciton recombination emissions in room-temperature cathodoluminescence spectra. It is concluded that lobe-shape marks appearing on the surface after an apparent lateral diamond growth came from defects left on the substrate surface. The origin of the apparent lateral growth observed is discussed in relation to an enhanced speed of the step edge growth at the substrate temperature elevated to ∼1000°C. |
doi_str_mv | 10.1143/JJAP.44.L216 |
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fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1143_JJAP_44_L216</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1143_JJAP_44_L216</sourcerecordid><originalsourceid>FETCH-LOGICAL-c383t-d0fcd296626e10575da5944c7fd67c09fe0342cb4325c588dd72595f7367a77a3</originalsourceid><addsrcrecordid>eNot0E9LwzAcxvEgCtbpzReQo4Kt-fNLsh7HdKtjoqCeS0xSF22TkRTUd69FTw_fy3P4IHROSUUp8OvNZvFYAVRbRuUBKigHVQKR4hAVhDBaQs3YMTrJ-f03pQBaoKfG9300H-UqOYebOES396P-8rrHN14PMVh8QQm5xCvfDxmvU_wMWI-48W87fO_GnQ4OL2MwLoxJjz6GfIqOOt1nd_a_M_Syun1eNuX2YX23XGxLw-d8LC3pjGW1lEw6SoQSVosawKjOSmVI3TnCgZlX4EwYMZ9bq5ioRae4VFopzWfo6u_XpJhzcl27T37Q6bulpJ1A2gmkBWgnEP4DoL5SHA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Hillock-Free Homoepitaxial Diamond (100) Films Grown at High Methane Concentrations</title><source>Institute of Physics IOPscience extra</source><source>Institute of Physics:Jisc Collections:IOP Publishing Read and Publish 2024-2025 (Reading List)</source><creator>Hamada, Mitsuhiro ; Teraji, Tokuyuki ; Ito, Toshimichi</creator><creatorcontrib>Hamada, Mitsuhiro ; Teraji, Tokuyuki ; Ito, Toshimichi</creatorcontrib><description>Improved growth processes for homoepitaxial diamond films with high quality and flat surfaces have been presented. Growth hillocks leading to rough surfaces were almost perfectly suppressed under the new growth processes, where the substrate temperature was set to a particular region. The high quality in electronic states was evidenced by the fact that the homoepitaxial films with thicknesses up to 11 µm gave intense free-exciton recombination emissions in room-temperature cathodoluminescence spectra. It is concluded that lobe-shape marks appearing on the surface after an apparent lateral diamond growth came from defects left on the substrate surface. The origin of the apparent lateral growth observed is discussed in relation to an enhanced speed of the step edge growth at the substrate temperature elevated to ∼1000°C.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/JJAP.44.L216</identifier><language>eng</language><ispartof>Japanese Journal of Applied Physics, 2005-01, Vol.44 (1L), p.L216</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c383t-d0fcd296626e10575da5944c7fd67c09fe0342cb4325c588dd72595f7367a77a3</citedby><cites>FETCH-LOGICAL-c383t-d0fcd296626e10575da5944c7fd67c09fe0342cb4325c588dd72595f7367a77a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Hamada, Mitsuhiro</creatorcontrib><creatorcontrib>Teraji, Tokuyuki</creatorcontrib><creatorcontrib>Ito, Toshimichi</creatorcontrib><title>Hillock-Free Homoepitaxial Diamond (100) Films Grown at High Methane Concentrations</title><title>Japanese Journal of Applied Physics</title><description>Improved growth processes for homoepitaxial diamond films with high quality and flat surfaces have been presented. Growth hillocks leading to rough surfaces were almost perfectly suppressed under the new growth processes, where the substrate temperature was set to a particular region. The high quality in electronic states was evidenced by the fact that the homoepitaxial films with thicknesses up to 11 µm gave intense free-exciton recombination emissions in room-temperature cathodoluminescence spectra. It is concluded that lobe-shape marks appearing on the surface after an apparent lateral diamond growth came from defects left on the substrate surface. The origin of the apparent lateral growth observed is discussed in relation to an enhanced speed of the step edge growth at the substrate temperature elevated to ∼1000°C.</description><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNot0E9LwzAcxvEgCtbpzReQo4Kt-fNLsh7HdKtjoqCeS0xSF22TkRTUd69FTw_fy3P4IHROSUUp8OvNZvFYAVRbRuUBKigHVQKR4hAVhDBaQs3YMTrJ-f03pQBaoKfG9300H-UqOYebOES396P-8rrHN14PMVh8QQm5xCvfDxmvU_wMWI-48W87fO_GnQ4OL2MwLoxJjz6GfIqOOt1nd_a_M_Syun1eNuX2YX23XGxLw-d8LC3pjGW1lEw6SoQSVosawKjOSmVI3TnCgZlX4EwYMZ9bq5ioRae4VFopzWfo6u_XpJhzcl27T37Q6bulpJ1A2gmkBWgnEP4DoL5SHA</recordid><startdate>20050101</startdate><enddate>20050101</enddate><creator>Hamada, Mitsuhiro</creator><creator>Teraji, Tokuyuki</creator><creator>Ito, Toshimichi</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20050101</creationdate><title>Hillock-Free Homoepitaxial Diamond (100) Films Grown at High Methane Concentrations</title><author>Hamada, Mitsuhiro ; Teraji, Tokuyuki ; Ito, Toshimichi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c383t-d0fcd296626e10575da5944c7fd67c09fe0342cb4325c588dd72595f7367a77a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hamada, Mitsuhiro</creatorcontrib><creatorcontrib>Teraji, Tokuyuki</creatorcontrib><creatorcontrib>Ito, Toshimichi</creatorcontrib><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hamada, Mitsuhiro</au><au>Teraji, Tokuyuki</au><au>Ito, Toshimichi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Hillock-Free Homoepitaxial Diamond (100) Films Grown at High Methane Concentrations</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>2005-01-01</date><risdate>2005</risdate><volume>44</volume><issue>1L</issue><spage>L216</spage><pages>L216-</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><abstract>Improved growth processes for homoepitaxial diamond films with high quality and flat surfaces have been presented. Growth hillocks leading to rough surfaces were almost perfectly suppressed under the new growth processes, where the substrate temperature was set to a particular region. The high quality in electronic states was evidenced by the fact that the homoepitaxial films with thicknesses up to 11 µm gave intense free-exciton recombination emissions in room-temperature cathodoluminescence spectra. It is concluded that lobe-shape marks appearing on the surface after an apparent lateral diamond growth came from defects left on the substrate surface. The origin of the apparent lateral growth observed is discussed in relation to an enhanced speed of the step edge growth at the substrate temperature elevated to ∼1000°C.</abstract><doi>10.1143/JJAP.44.L216</doi></addata></record> |
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title | Hillock-Free Homoepitaxial Diamond (100) Films Grown at High Methane Concentrations |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T01%3A16%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Hillock-Free%20Homoepitaxial%20Diamond%20(100)%20Films%20Grown%20at%20High%20Methane%20Concentrations&rft.jtitle=Japanese%20Journal%20of%20Applied%20Physics&rft.au=Hamada,%20Mitsuhiro&rft.date=2005-01-01&rft.volume=44&rft.issue=1L&rft.spage=L216&rft.pages=L216-&rft.issn=0021-4922&rft.eissn=1347-4065&rft_id=info:doi/10.1143/JJAP.44.L216&rft_dat=%3Ccrossref%3E10_1143_JJAP_44_L216%3C/crossref%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c383t-d0fcd296626e10575da5944c7fd67c09fe0342cb4325c588dd72595f7367a77a3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |