Efficient Reduction of Standby Leakage Current in LSIs for Use in Mobile Devices

Saved in:
Bibliographic Details
Published in:Japanese Journal of Applied Physics 2006-04, Vol.45 (4S), p.3150
Main Authors: Kudo, Hiroshi, Ishikawa, Kenji, Mishima, Yasuyoshi, Satou, Shigeru, Kihara, Fukuji, Okamato, Masayuki, Ito, Tetsuya, Suzuki, Yoshiyuki, Nomura, Toshio, Kawano, Michiari, Nishikawa, Katsunari, Ozaki, Yoshihiro
Format: Article
Language:English
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.45.3150