Novel Interface Properties of Au Overlayer on Top of C 60 Polycrystalline Film

From a temperature dependence of the dark electrical conductivity of Au overlayer σ M ( T ) measured along the interface direction on top of a C 60 polycrystalline film, a dramatic change in σ M is observed at T ≈255 K; σ M ( T ) increases with increasing temperature. As deduced from σ M versus 1/ T...

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 2006-07, Vol.45 (7R), p.5689
Main Authors: Liao, Jian-Liang, Chiu, Kuan-Cheng
Format: Article
Language:English
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Summary:From a temperature dependence of the dark electrical conductivity of Au overlayer σ M ( T ) measured along the interface direction on top of a C 60 polycrystalline film, a dramatic change in σ M is observed at T ≈255 K; σ M ( T ) increases with increasing temperature. As deduced from σ M versus 1/ T , an activation energy of 200 ±30 meV for T 255 K. These novel phenomena are explained by structural–electronic interaction on the Au/C 60 interface with a change in the properties of the induced surface states due to the rotational order/disorder phase transition.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.45.5689