Feedback Control System of Cantilever Contact Conditions during Conducting Atomic Force Microscopy Spectroscopy Measurements

Saved in:
Bibliographic Details
Published in:Japanese Journal of Applied Physics 2007-08, Vol.46 (8S), p.5598
Main Authors: Oohira, Tsunehiro, Ando, Atsushi
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c326t-e36507ce2a2fe1902ed129500f47ca508a5ca43177e2ad6bbefe21ac1212b91b3
cites cdi_FETCH-LOGICAL-c326t-e36507ce2a2fe1902ed129500f47ca508a5ca43177e2ad6bbefe21ac1212b91b3
container_end_page
container_issue 8S
container_start_page 5598
container_title Japanese Journal of Applied Physics
container_volume 46
creator Oohira, Tsunehiro
Ando, Atsushi
description
doi_str_mv 10.1143/JJAP.46.5598
format article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1143_JJAP_46_5598</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1143_JJAP_46_5598</sourcerecordid><originalsourceid>FETCH-LOGICAL-c326t-e36507ce2a2fe1902ed129500f47ca508a5ca43177e2ad6bbefe21ac1212b91b3</originalsourceid><addsrcrecordid>eNo1kN1KAzEQhYMoWKt3PkAewK2Z_G33sizWWloUqtdLNjsr0e6mJKlQ8OHtVr0658wMw-Ej5BbYBECK--Vy9jKReqJUMT0jIxAyzyTT6pyMGOOQyYLzS3IV48cxaiVhRL7niE1t7CctfZ-C39LNISbsqG9pafrktviF4bQ0Ng3auOR8H2mzD65_P032Ng12lnznLJ37YJGunQ0-Wr870M0ObfoPazRxH7DDPsVrctGabcSbPx2Tt_nDa7nIVs-PT-VslVnBdcpQaMVyi9zwFqFgHBvghWKslbk1ik2NskYKyPPjSaPrGlvkYCxw4HUBtRiTu9-_Q6UYsK12wXUmHCpg1UCuGshVUlcDOfEDfRVkUw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Feedback Control System of Cantilever Contact Conditions during Conducting Atomic Force Microscopy Spectroscopy Measurements</title><source>IOPscience journals</source><source>Institute of Physics</source><creator>Oohira, Tsunehiro ; Ando, Atsushi</creator><creatorcontrib>Oohira, Tsunehiro ; Ando, Atsushi</creatorcontrib><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/JJAP.46.5598</identifier><language>eng</language><ispartof>Japanese Journal of Applied Physics, 2007-08, Vol.46 (8S), p.5598</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c326t-e36507ce2a2fe1902ed129500f47ca508a5ca43177e2ad6bbefe21ac1212b91b3</citedby><cites>FETCH-LOGICAL-c326t-e36507ce2a2fe1902ed129500f47ca508a5ca43177e2ad6bbefe21ac1212b91b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,777,781,27905,27906</link.rule.ids></links><search><creatorcontrib>Oohira, Tsunehiro</creatorcontrib><creatorcontrib>Ando, Atsushi</creatorcontrib><title>Feedback Control System of Cantilever Contact Conditions during Conducting Atomic Force Microscopy Spectroscopy Measurements</title><title>Japanese Journal of Applied Physics</title><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNo1kN1KAzEQhYMoWKt3PkAewK2Z_G33sizWWloUqtdLNjsr0e6mJKlQ8OHtVr0658wMw-Ej5BbYBECK--Vy9jKReqJUMT0jIxAyzyTT6pyMGOOQyYLzS3IV48cxaiVhRL7niE1t7CctfZ-C39LNISbsqG9pafrktviF4bQ0Ng3auOR8H2mzD65_P032Ng12lnznLJ37YJGunQ0-Wr870M0ObfoPazRxH7DDPsVrctGabcSbPx2Tt_nDa7nIVs-PT-VslVnBdcpQaMVyi9zwFqFgHBvghWKslbk1ik2NskYKyPPjSaPrGlvkYCxw4HUBtRiTu9-_Q6UYsK12wXUmHCpg1UCuGshVUlcDOfEDfRVkUw</recordid><startdate>20070801</startdate><enddate>20070801</enddate><creator>Oohira, Tsunehiro</creator><creator>Ando, Atsushi</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20070801</creationdate><title>Feedback Control System of Cantilever Contact Conditions during Conducting Atomic Force Microscopy Spectroscopy Measurements</title><author>Oohira, Tsunehiro ; Ando, Atsushi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c326t-e36507ce2a2fe1902ed129500f47ca508a5ca43177e2ad6bbefe21ac1212b91b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Oohira, Tsunehiro</creatorcontrib><creatorcontrib>Ando, Atsushi</creatorcontrib><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Oohira, Tsunehiro</au><au>Ando, Atsushi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Feedback Control System of Cantilever Contact Conditions during Conducting Atomic Force Microscopy Spectroscopy Measurements</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>2007-08-01</date><risdate>2007</risdate><volume>46</volume><issue>8S</issue><spage>5598</spage><pages>5598-</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><doi>10.1143/JJAP.46.5598</doi></addata></record>
fulltext fulltext
identifier ISSN: 0021-4922
ispartof Japanese Journal of Applied Physics, 2007-08, Vol.46 (8S), p.5598
issn 0021-4922
1347-4065
language eng
recordid cdi_crossref_primary_10_1143_JJAP_46_5598
source IOPscience journals; Institute of Physics
title Feedback Control System of Cantilever Contact Conditions during Conducting Atomic Force Microscopy Spectroscopy Measurements
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-20T02%3A52%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Feedback%20Control%20System%20of%20Cantilever%20Contact%20Conditions%20during%20Conducting%20Atomic%20Force%20Microscopy%20Spectroscopy%20Measurements&rft.jtitle=Japanese%20Journal%20of%20Applied%20Physics&rft.au=Oohira,%20Tsunehiro&rft.date=2007-08-01&rft.volume=46&rft.issue=8S&rft.spage=5598&rft.pages=5598-&rft.issn=0021-4922&rft.eissn=1347-4065&rft_id=info:doi/10.1143/JJAP.46.5598&rft_dat=%3Ccrossref%3E10_1143_JJAP_46_5598%3C/crossref%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c326t-e36507ce2a2fe1902ed129500f47ca508a5ca43177e2ad6bbefe21ac1212b91b3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true