A Robust Silicon-on-Insulator Static-Random-Access-Memory Architecture by using Advanced Actively Body-Bias Controlled Technology

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 2008-04, Vol.47 (4R), p.2092
Main Authors: Hirano, Yuuichi, Tsujiuchi, Mikio, Ishikawa, Kozo, Shinohara, Hirofumi, Terada, Takashi, Maki, Yukio, Iwamatsu, Toshiaki, Eikyu, Katsumi, Uchida, Tetsuya, Obayashi, Shigeki, Nii, Koji, Tsukamoto, Yasumasa, Yabuuchi, Makoto, Ipposhi, Takashi, Oda, Hidekazu, Inoue, Yasuo
Format: Article
Language:English
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ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.47.2092