Simulation Study of Auger Electron Emission Features in Tip–Sample Electric Field Region for Scanning Probe Electron Energy Spectrometer

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 2009-12, Vol.48 (12), p.122301
Main Authors: Liu, WenJie, Xu, ChunKai, Li, YongGang, Ding, ZeJun, Xu, KeZun, Chen, XiangJun
Format: Article
Language:English
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ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.48.122301