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Measurements of Nonlinear Mark Edge Shift for Phase Change Optical Disk Systems

A new measurement method using the autocorrelation of readout pseudorandom sequence signals is proposed for evaluating the nonlinear mark edge shift of the phase change optical disk. The measurement abilities of the method are evaluated using 255-bit maximal length sequence signals. The nonlinear ma...

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Published in:Japanese Journal of Applied Physics 2012-08, Vol.51 (8), p.08JC02-08JC02-5
Main Authors: Okubo, Kohei, Ansai, Tsutomu, Tanabe, Takaya
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Language:English
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container_end_page 08JC02-5
container_issue 8
container_start_page 08JC02
container_title Japanese Journal of Applied Physics
container_volume 51
creator Okubo, Kohei
Ansai, Tsutomu
Tanabe, Takaya
description A new measurement method using the autocorrelation of readout pseudorandom sequence signals is proposed for evaluating the nonlinear mark edge shift of the phase change optical disk. The measurement abilities of the method are evaluated using 255-bit maximal length sequence signals. The nonlinear mark edge shifts are determined experimentally by using pulse train recordings and these results also agree with theoretical analysis.
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fullrecord <record><control><sourceid>ipap_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1143_JJAP_51_08JC02</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1143_JJAP_51_08JC02</sourcerecordid><originalsourceid>FETCH-LOGICAL-c229t-54775498f10940573530eec0b8bd551f435b42a54ff3ebdfcc42b44a31f607633</originalsourceid><addsrcrecordid>eNqFkLtPwzAYxC0EEqGwMntGSvDjcx5jFcojakmlwmw5iU1C85Idhv73pAo70-lOdzf8ELqnJKAU-GOWrfeBoAGJs5SwC-RRDpEPJBSXyCOEUR8Sxq7RjXPfsw0FUA_lO63cj9Wd7ieHB4Pfh75teq0s3il7xJvqS-ND3ZgJm8Hifa2cxmmt-jnOx6kpVYufGnfEh5ObdOdu0ZVRrdN3f7pCn8-bj_TV3-Yvb-l665eMJZMvIIoEJLGhJAEiIi440bokRVxUQlADXBTAlABjuC4qU5bACgDFqQlJFHK-QsHyW9rBOauNHG3TKXuSlMgzDnnGIQWVC4558LAMmlGN_5V_AU0NXv0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Measurements of Nonlinear Mark Edge Shift for Phase Change Optical Disk Systems</title><source>Institute of Physics IOPscience extra</source><source>Institute of Physics</source><creator>Okubo, Kohei ; Ansai, Tsutomu ; Tanabe, Takaya</creator><creatorcontrib>Okubo, Kohei ; Ansai, Tsutomu ; Tanabe, Takaya</creatorcontrib><description>A new measurement method using the autocorrelation of readout pseudorandom sequence signals is proposed for evaluating the nonlinear mark edge shift of the phase change optical disk. The measurement abilities of the method are evaluated using 255-bit maximal length sequence signals. The nonlinear mark edge shifts are determined experimentally by using pulse train recordings and these results also agree with theoretical analysis.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/JJAP.51.08JC02</identifier><language>eng</language><publisher>The Japan Society of Applied Physics</publisher><ispartof>Japanese Journal of Applied Physics, 2012-08, Vol.51 (8), p.08JC02-08JC02-5</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c229t-54775498f10940573530eec0b8bd551f435b42a54ff3ebdfcc42b44a31f607633</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Okubo, Kohei</creatorcontrib><creatorcontrib>Ansai, Tsutomu</creatorcontrib><creatorcontrib>Tanabe, Takaya</creatorcontrib><title>Measurements of Nonlinear Mark Edge Shift for Phase Change Optical Disk Systems</title><title>Japanese Journal of Applied Physics</title><description>A new measurement method using the autocorrelation of readout pseudorandom sequence signals is proposed for evaluating the nonlinear mark edge shift of the phase change optical disk. The measurement abilities of the method are evaluated using 255-bit maximal length sequence signals. The nonlinear mark edge shifts are determined experimentally by using pulse train recordings and these results also agree with theoretical analysis.</description><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNqFkLtPwzAYxC0EEqGwMntGSvDjcx5jFcojakmlwmw5iU1C85Idhv73pAo70-lOdzf8ELqnJKAU-GOWrfeBoAGJs5SwC-RRDpEPJBSXyCOEUR8Sxq7RjXPfsw0FUA_lO63cj9Wd7ieHB4Pfh75teq0s3il7xJvqS-ND3ZgJm8Hifa2cxmmt-jnOx6kpVYufGnfEh5ObdOdu0ZVRrdN3f7pCn8-bj_TV3-Yvb-l665eMJZMvIIoEJLGhJAEiIi440bokRVxUQlADXBTAlABjuC4qU5bACgDFqQlJFHK-QsHyW9rBOauNHG3TKXuSlMgzDnnGIQWVC4558LAMmlGN_5V_AU0NXv0</recordid><startdate>20120801</startdate><enddate>20120801</enddate><creator>Okubo, Kohei</creator><creator>Ansai, Tsutomu</creator><creator>Tanabe, Takaya</creator><general>The Japan Society of Applied Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20120801</creationdate><title>Measurements of Nonlinear Mark Edge Shift for Phase Change Optical Disk Systems</title><author>Okubo, Kohei ; Ansai, Tsutomu ; Tanabe, Takaya</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c229t-54775498f10940573530eec0b8bd551f435b42a54ff3ebdfcc42b44a31f607633</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Okubo, Kohei</creatorcontrib><creatorcontrib>Ansai, Tsutomu</creatorcontrib><creatorcontrib>Tanabe, Takaya</creatorcontrib><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Okubo, Kohei</au><au>Ansai, Tsutomu</au><au>Tanabe, Takaya</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Measurements of Nonlinear Mark Edge Shift for Phase Change Optical Disk Systems</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>2012-08-01</date><risdate>2012</risdate><volume>51</volume><issue>8</issue><spage>08JC02</spage><epage>08JC02-5</epage><pages>08JC02-08JC02-5</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><abstract>A new measurement method using the autocorrelation of readout pseudorandom sequence signals is proposed for evaluating the nonlinear mark edge shift of the phase change optical disk. The measurement abilities of the method are evaluated using 255-bit maximal length sequence signals. The nonlinear mark edge shifts are determined experimentally by using pulse train recordings and these results also agree with theoretical analysis.</abstract><pub>The Japan Society of Applied Physics</pub><doi>10.1143/JJAP.51.08JC02</doi></addata></record>
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1347-4065
language eng
recordid cdi_crossref_primary_10_1143_JJAP_51_08JC02
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title Measurements of Nonlinear Mark Edge Shift for Phase Change Optical Disk Systems
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T21%3A43%3A55IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ipap_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Measurements%20of%20Nonlinear%20Mark%20Edge%20Shift%20for%20Phase%20Change%20Optical%20Disk%20Systems&rft.jtitle=Japanese%20Journal%20of%20Applied%20Physics&rft.au=Okubo,%20Kohei&rft.date=2012-08-01&rft.volume=51&rft.issue=8&rft.spage=08JC02&rft.epage=08JC02-5&rft.pages=08JC02-08JC02-5&rft.issn=0021-4922&rft.eissn=1347-4065&rft_id=info:doi/10.1143/JJAP.51.08JC02&rft_dat=%3Cipap_cross%3E10_1143_JJAP_51_08JC02%3C/ipap_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c229t-54775498f10940573530eec0b8bd551f435b42a54ff3ebdfcc42b44a31f607633%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true