Near-Ideal Si-SiO 2 Interfaces

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Bibliographic Details
Published in:IBM journal of research and development 1980-05, Vol.24 (3), p.348-352
Main Authors: Kasprzak, L. A., Gaind, A. K.
Format: Article
Language:English
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ISSN:0018-8646
0018-8646
DOI:10.1147/rd.243.0348