Defect-Related Breakdown and Conduction in SiO 2

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Bibliographic Details
Published in:IBM journal of research and development 1980-07, Vol.24 (4), p.469-479
Main Authors: Shatzkes, Morris, Av-Ron, Moshe, Gdula, Robert A.
Format: Article
Language:English
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ISSN:0018-8646
0018-8646
DOI:10.1147/rd.244.0469