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Semiconductor Analysis Using Finite Elements—Part II: IGFET and BJT Case Studies

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Bibliographic Details
Published in:	IBM journal of research and development 1981-07, Vol.25 (4), p.246-260
Main Authors:	Hachtel, G. D., Mack, M. H., O'Brien, R. R.
Format:	Article
Language:	English
Citations:	Items that cite this one
Online Access:	Get full text
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