Gross delay defect evaluation for a CMOS logic design system product

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Bibliographic Details
Published in:IBM journal of research and development 1990-03, Vol.34 (2-3), p.325-338
Main Authors: BULA, O, MOSER, J, TRINKO, J, WEISSMAN, M, WOYTOWICH, F
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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ISSN:0018-8646
2151-8556
0018-8646
DOI:10.1147/rd.342.0325