Characterization of the Contact Resistance of Cathodic SOFC Contacting

DC conductivity experiments were carried out in order to characterize the area specific resistances (ASR) of various multi-layer-structures. They represent the contacting interface between cathode and interconnector of state-of-the-art planar anode-supported SOFCs. The investigation focused on quant...

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Bibliographic Details
Published in:ECS transactions 2015, Vol.68 (1), p.751-756
Main Authors: Udomsilp, David, Roehrens, Daniel, Menzler, Norbert H., Conradt, Reinhard, Guillon, Olivier
Format: Article
Language:English
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Summary:DC conductivity experiments were carried out in order to characterize the area specific resistances (ASR) of various multi-layer-structures. They represent the contacting interface between cathode and interconnector of state-of-the-art planar anode-supported SOFCs. The investigation focused on quantifying the influence of various chromium evaporation protection layer materials (MnO x , MnCo 1.9 Fe 0.1 O 4 (MCF)), perovskitic cathode contact layers (LCC10, LCC12, LSCF), operational parameters during stack joining and the effect of pre-annealing of multi-layer samples on the overall ASR of the model system. The results demonstrate the influence of different material combinations as well as the duration of heat treatment during the joining process on the cell resistance, whereas we have not observed an obvious effect of pre-annealing.
ISSN:1938-5862
1938-6737
DOI:10.1149/06801.0751ecst