Scanning Probe-Based In Situ High Temperature Electrical and Electrochemical Measurements in Atmospheric Pressure

Atomic force microscopy (AFM)-based study of electrical and electrochemical properties of a material/system at an elevated temperature in atmospheric pressure has been limited to ~250°C in conventional AFM setups. In this report, we have demonstrated the viability of a new approach for high temperat...

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Bibliographic Details
Published in:ECS transactions 2016-07, Vol.72 (28), p.11-20
Main Authors: Ng, Chee Seng, Baek, Jong Dae, Zade, Vishal, Villegas, Adrian, Lee, Tsung-Han, Su, Pei-Chen, Martini, Ashlie, Lee, Min Hwan
Format: Article
Language:English
Online Access:Get full text
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Summary:Atomic force microscopy (AFM)-based study of electrical and electrochemical properties of a material/system at an elevated temperature in atmospheric pressure has been limited to ~250°C in conventional AFM setups. In this report, we have demonstrated the viability of a new approach for high temperature electrical and electrochemical studies (up to 700°C) in a conventional AFM setup by employing a combination of a micron-scale heater stage (MHS) and custom-made all-metal tips. We present the design, fabrication process and characterization of the MHS and all-metal tips. A temperature dependent impedance measurement on an MHS-integrated half-cell was then successfully demonstrated with a custom-made Pt-Ir tip. Issues and possible room to improve regarding the new approach were also discussed.
ISSN:1938-5862
1938-6737
DOI:10.1149/07228.0011ecst