Degradation Analysis of SOFC Performance (2) - Severe Operation with an Instantaneous Load Fluctuation

• Published in: ECS transactions 2019-07, Vol.91 (1), p.771-779
• Main Authors: Asano, Koichi, Ido, Akifumi, Morita, Hiroshi, Yamamoto, Tohru, Mugikura, Yoshihiro
• Format: Article
• Language: English
• ISSN: 1938-5862; 1938-6737; 1938-6737; 1938-5862
• DOI: 10.1149/09101.0771ecst

Central Research Institute of Electric Power Industry (CRIEPI) has operated four types of SOFC stacks, which are developed by KYOCERA, NGK SPARK PLUG (NTK), NGK INSULATORS (NGK), and DENSO under NEDO's project on high efficiency and toughness of SOFC cell-stacks (FY2018-FY2019). In order to evaluate the applicability of SOFC for an instantaneous load fluctuation, the load-fluctuation tests in this project have been carried out. It was determined as a test protocol that the periodic current fluctuations which are the waveform of triangular wave with the periods of time for 0.02-20 sec are applied to SOFC cell-stacks as a severe operating condition with the instantaneous load fluctuation. The durability with instantaneous load fluctuation for 2,000 h applying this test protocol was evaluated. As a result, the instantaneous response of cell voltage and power density, and the voltage decay rates of cell voltage of each SOFC cell-stack during the load fluctuation tests were clarified.