Carrier Transportation of Rapid Thermal Annealed CeO[sub 2] Gate Dielectrics

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Bibliographic Details
Published in:Electrochemical and solid-state letters 2004, Vol.7 (12), p.E55
Main Authors: Wang, Jer Chyi, Chiang, Kuo Cheng, Lei, Tan Fu, Lee, Chung Len
Format: Article
Language:English
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ISSN:1099-0062
DOI:10.1149/1.1819855