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Refractive index profiles of thermally grown and chemically vapor deposited films on silicon

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Bibliographic Details
Published in:	Journal of the Electrochemical Society 1990-11, Vol.137 (11), p.3536-3541
Main Authors:	CHONGSAWANGVIROD, S, IRENE, E. A, KALNITSKY, A, TAY, S. P, ELLUL, J. P
Format:	Article
Language:	English
Subjects:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films Physics
Citations:	Items that cite this one
Online Access:	Get full text
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