Minority carrier lifetime in furnace and E-beam annealed CZ silicon

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Bibliographic Details
Published in:Journal of the Electrochemical Society 1987-05, Vol.134 (5), p.1239-1243
Main Authors: SUSI, E, LULLI, G, PASSARI, L
Format: Article
Language:English
Subjects:
Charge carriers: generation, recombination, lifetime, and trapping
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Conductivity phenomena in semiconductors and insulators
Electronic transport in condensed matter
Exact sciences and technology
Physics
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ISSN:0013-4651
1945-7111
DOI:10.1149/1.2100649