Electrochemical Photocapacitance Spectroscopy: A New Method for Characterization of Deep Levels in Semiconductors

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Bibliographic Details
Published in:Journal of the Electrochemical Society 1982-04, Vol.129 (4), p.891-893
Main Authors: Haak, Ron, Ogden, Cameron, Tench, Dennis
Format: Article
Language:English
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ISSN:0013-4651
1945-7111
DOI:10.1149/1.2123996