Low Leakage Current Structures with Subgate in Metal-Induced Unilaterally Crystallized Silicon Thin-Film Transistors

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Bibliographic Details
Published in:Journal of the Electrochemical Society 2008, Vol.155 (7), p.H536
Main Authors: Kang, Il-Suk, Yu, Sung-Hun, Son, Se-Wan, Seo, Jeonghun, Joo, Seung-Ki
Format: Article
Language:English
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ISSN:0013-4651
DOI:10.1149/1.2918899