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Performance of Ge/Si Receivers at 1310 nm
We are studying three types of these detectors for use at 1310 nm; normal incident illuminated p-i-n detectors (NI-PD), waveguide p-i-n detectors (WG-PD), and avalanche photodetectors (APDs). NI-PDs have achieved -14.5 dBm sensitivity at 10 Gb/s and 850 nm, which is comparable to similarly packaged...
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Main Authors: | , , , , , , , , , |
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Format: | Conference Proceeding |
Language: | English |
Citations: | Items that cite this one |
Online Access: | Get full text |
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Summary: | We are studying three types of these detectors for use at 1310 nm; normal incident illuminated p-i-n detectors (NI-PD), waveguide p-i-n detectors (WG-PD), and avalanche photodetectors (APDs). NI-PDs have achieved -14.5 dBm sensitivity at 10 Gb/s and 850 nm, which is comparable to similarly packaged GaAs devices. Unlike GaAs detectors, however, the Ge detectors can also operate at 1310nm, with a ~0.5dB sensitivity improvement expected. WG-PDs have achieved bandwidths of approximately 30 GHz at 1550 nm with internal quantum efficiencies of 90%, and similar, or better, performance is also expected at 1310 nm. Normal incident APDs operating at 1310 nm have achieved a gain-bandwidth product of 153 GHz which exceeds that of a commercial InP-based APDs, These devices also have a primary responsivity of 0.54 A/W with a 3-dB bandwidth of 9GHz at a gain of 17. |
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ISSN: | 1938-5862 1938-6737 |
DOI: | 10.1149/1.2986813 |