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Optical Bleaching of Thin Film Ge on Si
Thin film Ge on Si is a potential active material candidate for electrically pumped monolithically integrated Si-based light emitters. Theoretical analysis has shown that a combination of strain and n-type doping can modify the band structure of Ge so that it exhibits direct bandgap properties. Direc...
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creator | Sun, Xiaochen Liu, Jifeng Kimerling, Lionel Michel, Jurgen |
description | Thin film Ge on Si is a potential active material candidate for electrically pumped monolithically integrated Si-based light emitters. Theoretical analysis has shown that a combination of strain and n-type doping can modify the band structure of Ge so that it exhibits direct bandgap properties. Direct band-to- band optical transition is observed from the room temperature photoluminescence at around 1550nm. An optical bleaching ef- fect occurring in lock-in pump-probe measurements indicates a precursor to optical net gain. |
doi_str_mv | 10.1149/1.2986848 |
format | conference_proceeding |
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Theoretical analysis has shown that a combination of strain and n-type doping can modify the band structure of Ge so that it exhibits direct bandgap properties. Direct band-to- band optical transition is observed from the room temperature photoluminescence at around 1550nm. An optical bleaching ef- fect occurring in lock-in pump-probe measurements indicates a precursor to optical net gain.</abstract><doi>10.1149/1.2986848</doi><tpages>9</tpages></addata></record> |
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identifier | ISSN: 1938-5862 |
ispartof | ECS transactions, 2008, Vol.16 (10), p.881-889 |
issn | 1938-5862 1938-6737 |
language | eng |
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title | Optical Bleaching of Thin Film Ge on Si |
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